Abstract: To investigate the relationship between the resistance of cotton to Apolygus lucorum （Meyer-Dür） and the leaf characteristics, the resistance levels of different cotton varieties to A. lucorum were evaluated in the field, and the leaf thickness, the leaf epidermis thickness and the gossypol gland density of cotton leaves during different growth stages were measured in the laboratory. The results indicated that Jinmian 26, Jifeng 989, Chang D and Yazhoumian had high resistance to A. lucorum. The leaf thickness, the leaf epidermis thickness and the gossypol glands density of cotton leaves during different growth stages were significantly different among different varieties. The host resistance to A. lucorum showed significant correlation with the leaf epidermis thickness and the gossypol gland density of cotton leaves at bolling stage （y=20.673+0.415x，R2=0.305，P=0.012；y=1.049+0.049x，R2=0.207，P=0.044）. The results suggest that cotton varieties with thinner leaf epidermis and more gossypol glands at a certain growth period can be used to minimize the damage by A. lucorum.  

Key words: Apolygus lucorum, cotton, insect resistance, leaf thickness, gossypol gland density